Center for Materials Research

Ellipsometry

Gaertner Production Ellipsometer

This machine has a laser that emits light at an angle through any transparent film and a detector at the opposing angle.  Using the refractive index of the film and Snell's Law, it is able to calculate the thickness of the film.

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Center for Materials Research, PO Box 642711, Washington State University, Pullman, WA, 99164-2711 USA